Description
I will present the remaining lattice-based candidates for standardization by NIST (2 signature schemes, 5 encryption schemes). At a high level, these can all be interpreted as straightforward instantiations of decades-old paradigms. But when we look under the hood, all of them make design choices which impact their security, efficiency and portability in distinct manners; we will discuss these. Finally, we will look at ninja tricks that can be pulled off with specific lattice-based schemes; in *some* contexts, these allow, with minimal changes to the schemes, to greatly decrease their communication overhead.
Infos pratiques
Prochains exposés
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Securing processor's microarchitecture against SCA in a post-quantum cryptography setting
Orateur : Vincent MIGLIORE - LAAS-CNRS
Hardware microarchitecture is a well-known source of side-channel leakages, providing a notable security reduction of standard cryptographic algorithms (e.g. AES) if not properly addressed by software or hardware. In this talk, we present new design approaches to harden processor's microarchitecture against power-based side-channel attacks, relying on configurable and cascadable building blocks[…]-
SemSecuElec
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Side-channel
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Micro-architectural vulnerabilities
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Onysis: A secure European SoC FPGA
Orateur : Adrien GRASSEIN - Nanoxplore
Developed in collaboration with the DGA, the Onysis project introduces a European SoC FPGA designed to embed advanced hardware security features. This presentation will provide an overview of the Onysis architecture, focusing specifically on its native mechanisms to protect critical systems. We will detail the implementation of its integrated security subsystem, covering the secure boot sequence[…]-
SemSecuElec
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Using High Level Profiling Data to Early Assess the Fault Tolerance of Complex Digital Components
Orateur : Luc NOIZETTE - Nuclétudes (filiale Ariane group)
This presentation outlines an innovative methodology for estimating the fault tolerance of complex components based on application profiling obtained using a high-level virtual platform. A derating factor, derived exclusively from profiling metrics (e.g., lifetime in memory and registers), is calibrated using a reliability dataset collected from a set of benchmarks. Applying it to test softwares[…]-
SemSecuElec
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Fault injection
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